Aspects of transmission electron microscopy image processing of composites containing germanium and silicon nanocrystals

Article Name:		ASPECTS OF TRANSMISSION ELECTRON MICROSCOPY IMAGE PROCESSING OF COMPOSITES CONTAINING GERMANIUM AND SILICON NANOCRYSTALS
Authors:		D.A. Grachev (Russian Federation), A.V. Ershov (Russian Federation), D.A. Pavlov (Russian Federation)
Address:		D.A. Grachev grachov@phys.unn.ru Lobachevsky State University of Nizhni Novgorod, Russia A.V. Ershov ershov@phys.unn.ru Lobachevsky State University of Nizhni Novgorod, Russia D.A. Pavlov pavlov@unn.ru Lobachevsky State University of Nizhni Novgorod, Russia
Abstract:		Improved visualization technique and analysis of the high-resolution transmission electron microscopy images of the dielectric composite structures contained silicon and germanium crystalline nanoparticles have been performed. The modified algorithm of Wiener filtering and geometric phase processing taking into account the features of electron microscopy images both in direct and in reciprocal spaces linked by Fourier transform has been proposed and used effectively. In particular, it has been obtained counter plots of angular and spatial orientation of the nanocrystals, as well as has been measured their lateral dimensions for multilayer nanoperiodic SiO_x/ZrO₂ and Ge/SiO₂ structures. In general, the color-layer representation of information on the electron microscopy images is a handy tool to show structure and interaction between individual structural phases of the advanced composite nanomaterials.
Language:		English

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